Stephen Se, Senior Research Manager at FLIR Systems, presents the “Deep Learning for Manufacturing Inspection: Case Studies” tutorial at the September 2020 Embedded Vision Summit.
Deep learning has revolutionized artificial intelligence and has been shown to provide the best solutions to many problems in computer vision, image classification, speech recognition and natural language processing. See presents highlights from our experience in deep learning machine vision applications such as manufacturing inspection, defect detection and classification.
Deep learning has gained significant attention in the machine vision industry because it does not require the complex algorithm development required for traditional rule-based image processing techniques. Se covers the deep learning workflow from data collection to training and deployment, including transfer learning. Se also presents a few case studies from manufacturing inspection applications.
See here for a PDF of the slides.