Now available—the Embedded Vision Summit On-Demand Edition! Gain valuable computer vision and edge AI insights and know-how from the experts at the 2021 Summit.

Jake Lee, Principal Engineer and Head of the Machine Learning Group at Samsung, presents the “Image-Based Deep Learning for Manufacturing Fault Condition Detection” tutorial at the September 2020 Embedded Vision Summit. In this presentation, Lee explores applying deep learning to analyzing manufacturing parameter data to detect fault conditions. The manufacturing…

“Image-Based Deep Learning for Manufacturing Fault Condition Detection,” a Presentation from Samsung

Register or sign in to access this content.

Registration is free and takes less than one minute. Click here to register and get full access to the Edge AI and Vision Alliance's valuable content.

Here you’ll find a wealth of practical technical insights and expert advice to help you bring AI and visual intelligence into your products without flying blind.



1646 North California Blvd.,
Suite 360
Walnut Creek, CA 94596 USA

Phone: +1 (925) 954-1411
Scroll to Top